Atomic Force Microscope Accessories
AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.
Additional modes and accessories expand the capabilities of your microscope.
For the LS, NP and SA AFM. Z piezoelectric/probe holder with strain gauge. Designed for general AFM applications, and...Learn More...