|High Resolution Video Microscope
|Readily locate Features for Scanning
|Multiple Sample Stage or Vacuum Chuck
|Optimized for specific technical samples
|Closed Loop XY scanner
|Great accuracy with rapid zoom to feature
|Probe Exchange Tool
|Reduce time for probe exchange
|In plane flexure XY scanner
|Minimal out of plane motion in images
|Labview software with USB communication
|Readily adaptable to new operating systems
|Uses Industry standard probes
|Probes for specific measurements are readily available.
|Includes Vibrating, Non-Vibrating modes
NP AFM Product Datasheet PDF
NP AFM-4022 3D
NP AFM-4012 3D
Nano-Profiler AFM Overview
The NP AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP AFM system, and several stage options are available for many types of samples. The Nano-Profiler AFM is primarily used for routine scanning of technical samples such as wafers and disks or for nanotechnology research.
Key Features of the NP AFM
|The NP AFM accommodates industry-standard sized probes and is used for profiling technical samples including wafers and disks in industry applications.
|Standard Operating Modes
|Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.
|Three Sample Stage Options
|Three sample stage options can accommodate different samples with sizes as large as 200mm X 200mm X 20mm.
|Linearized X, Y Piezoelectric Scanner
|Piezoelectric X and Y scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
|Direct-Drive Tip Approach
|A linear motion stage is used to move the probe perpendicular to the sample. Probe angle alignment is not required, facilitating a much faster probe approach.
|Industry standard programming environment, functions include setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. Compatible with older operating systems as well.
|The video optical microscope in a NP-2 AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach.
NP AFM Capabilities
|Visualization of Surface Features
|Visualization of surface features can help understand why a process is working or not working. AFM offers extreme contrast on flat samples often encountered in industry wafers and disks for quality control and assurance.
|Surface roughness measurements at the nanoscale are only possible with an atomic force microscope. With the appropriate vibration isolation enclosure, it is possible to measure surface textures under 0.1 nm.
|The NP AFM is a stylus profiler capable of making step height measurements from 0.3 to 500 nanometers. An included video microscope is essential for locating regions of interest for scanning.