AFM Workshop


Table Top Atomic Force Microscope
For research and applications

This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Price Range*
$32,275.00 -
* Prices vary depending on options purchased, importation taxes, and installation - training fees.

Click to Submit Inquiries or Questions


TT-2 AFM Details

Video Microscope
Probe Holder
TT-2 AFM Overview
Sample Sizes: Up to 1" X 1" X 3/4"
Standard Scanning Modes: Vibrating (Tapping), Non-Vibrating (Contact), Phase, LFM
Scanners: 100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm
Video Optical Microscope: Zoom to 400X, 2 µm resolution
Stage and EBox Size: Compact table top design
Download: TT-2 AFM Product Datasheet PDF
3-D Model of TT-2 AFM PDF

Key Features and Benefits of the TT-2 AFM

Low Noise Floor With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.
Direct Drive Tip Approach A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.
Research Grade Video Optical Microscope With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.
Multiple Scanners Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.
LabView Software The TT-2 uses industry standard lab view software. For customization, the systems VI's are readily available.
Modular Design Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.
Simple Probe Exchange With the removable probe holder, exchanging probes is simple, and takes less than a minute.
Ligh Lever Large Adjustment Range Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.


Research With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More
Instrument Innovators  The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture. Read More
Education With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation. Read More


The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for industry, research, and education can be found by clicking on any of the links below:
Photonics Applications
Polymer Applications
Nanoparticle Applications
Life Sciences Applications
Process Development and Process Control Applications
Education Applications

TT-2 AFM Videos

A 40 minute recording of a live stream TT-2 AFM demonstration is available here, along with a series of brief, two-minute introductory videos of the TT-2 AFM and its components here.

TT-2 AFM Stage

The TT-2 AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

Rigid Frame Design: The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.
Light Lever AFM Force Sensor: Light lever force sensors are used in almost all AFM and permit many types of experiments.
Integrated Probe Holder/Probe Exchanger: A unique probe holder and clipping mechanism allows quick and easy probe exchange.
Direct Drive Z Stage: A linear motion stage is used to move the probe in a perpendicular motion to the sample. Probe/sample angle alignment is not required, facilitating a much faster probe approach.
Small Footprint: The stage dimensions of 4" X 7" require little space and fit easily on a tabletop.
Precision XY Stage with Micrometer: The sample is moved relative to the probe with a precision XY micrometer stage. Thus, the sample can be moved without touching it.
Modes Electric Plug: A six pole electrical plug is located at the back of the stage to expand the capabilities of the TT-2 AFM.
XYZ Precision Piezo Scanner: The modified tripod design utilizes temperature compensated strain gauges which assure accurate measurements from images. Also, with this design it is possible to rapidly zoom into a feature visualized in an image.
Laser/Detector Alignment: Both the light lever laser and the photo detector adjustment mechanism may be directly viewed. This feature simplifies the laser/detector alignment.
Adaptable Sample Holder: At the top of the XYZ scanner is a removable cap that holds the sample. The cap can be modified - or a new cap can be designed – to hold many types of samples.
TT 2AFM Stage 1 pm rev

Electronics in the TT-2 AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

28-Bit Scanning: Scanning waveforms for generating motion in the XY axis with the piezo scanners are created with 24-bit DACS and HV amplifiers with 4 bits of gain control, giving 28 bits scanning. Feedback control using the XY strain gauges assures accurate tracking of the probe over the surface.
Phase and Amplitude Detector Circuit: Phase and amplitude in the EBox are measured with highly stable phase and amplitude chips. The system can be configured to feed back on either phase or amplitude when scanning in vibrating mode.
Signal Accessible: At the rear of the EBox is a 50 pin ribbon cable that gives access to all of the primary electronic signals without having to open the EBox.
Status Lights: At the front of the EBox is a light panel that has seven lights. In the unlikely event of a circuit failure, these lights are used to determine the status of the EBox power supplies.
Precision Analog Feedback: Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.
Variable Gain High Voltage Piezo Drivers: An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers.
TT-AFM Ebox diagram
TT-2 AFM Software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the TT-2 AFM to be readily combined with any other instrument using LabVIEW.

Prescan Window

Pre-Scan Window

A pre-scan window includes all of the functions that are required before a scan is started. The functions are presented in a logical sequence on the screen.


Scan Window

Scan Window

Once all of the steps in the pre-scan window are completed, the scan window is used for measuring images. Scan parameter, Z feedback parameters, and image view functions may be changed with dialogs on this screen.


LabVIEW programming window

LabVIEW Window

Industry standard programming environment. Readily customized and modified for specialized applications. Instrumentation already using LabVIEW can be added to the TT-2 AFM to create new capabilities.



Image Analysis Software

Included with the TT-2 AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze, and display SPM images.

Image Analysis Software

  • Visualization: false color representation with different types of mapping
  • Shaded, logarithmic, gradient- and edge-detected, local contrast representation, and Canny lines
  • OpenGL 3D data display: false color or material representation
  • Easily editable color maps and OpenGL materials
  • Basic operations: rotation, flipping, inversion, data arithmetic, crop, and resampling
  • Leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
  • Value reading, distance, and angle measurement
  • Profiles: profile extraction, measuring distances in profile graph, and profile export
  • Filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, and checker pattern removal
  • General convolution filter with user-defined kernel
  • Statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, and facet orientation analysis
  • Statistical quantities calculated from area under arbitrary mask
  • Row/column statistical quantities plots
  • ISO roughness parameter evaluation
  • Grains: threshold marking and un-marking, and watershed marking
  • Grain statistics: overall and distributions of size, height, area, volume, boundary length, and bounding dimensions
  • Integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), and wavelet anisotropy detection
  • Fractal dimension analysis
  • Data correction: spot remove, outlier marking, scar marking, and several line correction methods (median, modus)
  • Removal of data under arbitrary mask using Laplace or fractal interpolation
  • Automatic XY plane rotation correction
  • Arbitrary polynomial deformation on XY plane
  • 1D and 2D FFT filtering
  • Fast scan axis drift correction
  • Mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, and shrinking
  • Simple graph function fitting, critical dimension determination
  • Force-distance curve fitting
  • Axes scale calibration
  • Merging and immersion of images
  • Tip modeling, blind estimation, dilation and erosion
TT-2 AFM Video Microscope

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach. The TT-2 AFM includes a high performance video optical microscope along with a 3 camera, light source, microscope stand, and Windows software for displaying images.

TT-AFM Video Optical Microscope shows test structureHere the video optical microscope allows viewing features on a test structure. The AFM cantilever is on the right. Three images show results of areas selected for AFM scanning.

TT-AFM Video Microscope on HOPGThe video optical microscope zooms in to show an HOPG sample surface and the AFM cantilever.

7 to 1 Mechanical Zoom

TT-AFM laser alignment through video microscope

TT-AFM laser alignment through video microscope

With a 7:1 mechanical zoom, it is possible to use a large field of view to locate features for imaging. It is then possible to zoom in to get very high resolution video microscope images.

TT-2 AFM Probe Holder

The TT-2 AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. With the probe exchange tool, changing probes takes only a few minutes.


Quick and Easy AFM Probe Exchange

probe holder insert pmThe probe holder insert is removed from the TT-2 AFM.



probe exchange pmR to L: Box of probes, probe exchange tool, and probe holder insert.



activating AFM probe spring clipActivating the probe spring clip by applying light pressure.



TT-2 AFM Image Gallery

750 pm silicon carbide terraces

3d height image of regular grid-patterned calibration sample

E. coli cell, displaying fimbriae & polar flagellum

"Single E. coli bacterial cell, displaying fimbriae & polar flagellum"

1 and 3 nm quantum dots; 100 nm image

Self-assembled lipid nanotubes, 5 µm x 5 µm

Self-assembled lipid nanotubes; 5 µm x 5 µm height image

3d height image of a mixture of 90 and 30nm PS nanoparticles

Multiphase Polymer Film, 3D, phase signal overlaid

Multiphase Polymer Film - 3D shape from topography with phase signal overlaid as color

Defects on 0.3 nm Si Terraces, 4 µm x4 µm

AFM image of defects on 0.3 nm Si Terraces; 4 µm x 4 µm

3 µm x 3 µm image of 173 nm latex spheres

Latex spheres; 3 µm x 3 µm image of 173 nm latex spheres

AFM Workshop Image DNA 3um r1 pm

Double stranded DNA molecules; 3 µm image

Bacillus bacterial spores

1 and 3 nm quantum dots; 500 nm image

Aluminum foil, dull side, 3-D image; 50 µm x 50 µm.

Aluminum foil, dull side, 3D image; 50 µm x 50 µm

Self-assembled lipid nanotubes; 20 µm x 20 µm.

Self-assembled lipid nanotubes; 20 µm x 20 µm, AFM height image

Highly Oriented Pyrolitic Graphite 5 µm x 5 µm

Highly Oriented Pyrolitic Graphite (HOPG) 5 µm x 5 µm, showing atomic steps

Red blood cells 3-D AFM image

Red blood cells 3D height AFM image

MFM image of magnetic disk; 40 µm x 40 µm

MFM image of magnetic disk; 40 µm x 40 µm

Polymer used in glue 10 µm x 10 µm 3D color scale

Polymer used in common glue 10 µm x 10 µm image, 3D color scale view

Nanolithography, 25 µm x 25 µm image

Nanolithography, Changing Probe Force. 25 µm x 25 µm image of lines made in PMMA surface. Each line is 1 µm apart; each has differing probe force.

Inverted Optical microscope image of Caco-2 cells

Inverted optical microscope image of Caco-2 cells; box indicates area selected for AFM scanning

AFM scan of Caco-2 cells; 48 µm x 48 µm.

AFM image of Caco-2 cells; 48 µm x 48 µm. AFM scan of area selected by box in previous inverted optical microscope photo

Inverted optical Image of neutraphil a1 cells

Inverted optical image of neutrophil and erythrocyte cells, AFM probe is seen as a shadow

Neutrophil & erythrocyte cells; 50 µm light shaded

Neutrophil & erythrocyte cells; 50 µm amplitude image, measured in location as seen in previous image

Tip checker sample, 2-D color scale

Tip checker sample, 2D color scale 20 µm x 20 µm image

Caco-2 cells. Left: Epiflourescence. Right: AFM

Caco-2 cells. Left: Epiflourescence image of Caco-2 cells treated with quantum dots. Right: 50 µm x 50 µm AFM image of Caco-2 cells

Holes in polymer film, 10 µm x 10 µm AFM Image

Holes in polymer film; 10 µm x 10 µm AFM Image

Patterns on ferroelectric material 50 µm x 50 µm

Patterns fabricated on ferroelectric material; 50 µm x 50 µm light shaded image

Multiphase polymer,10µm, height and phase

Light shaded image of cell, 7 µm x 7 µm AFM Image

E. coli bacterial cells; 7 µm x 7 µm amplitude image

Vibrating mode showing three species of bacteria

Vibrating mode image showing three different species of bacteria

Amplitude Image of Leishmania 25 µm x 25 µm

Amplitude image of Leishmania parasites 25 µm x 25 µm

Waffle test pattern, 2100 lines per mm, 8 µm x 8 µm color scale image

Polymeric waffle test pattern 2100 lines per mm; 8 µm x 8 µm height image

Marks made with AFM Lithography 20 um x 20 µm

Marks made with AFM Lithography; 20 µm x 20 µm

Indium Tin Oxide (ITO), 2 µm x 2 µm color scale image

Indium Tin Oxide (ITO); 2 µm x 2 µm height image

Tobacco Mosaic Virus 1.2 µm x 1.2 µm color scale

Tobacco Mosaic Virus; 1.5 µm x 1.5 µm image of 17 nm diameter viruses

Conductive AFM scan, standard reference sample

Conductive AFM scan, standard reference sample; 10 µm x 10 µm conductivity image 

0.3 nm terraces on Si, 5 µm x 5 µm color scale image

0.3 nm terraces on Si; 5 µm x 5 µm color scale image

Gold nanoparticles 2D color scale 14 nm diameter

Gold nanoparticles, 2D color scale 2 µm x 2 µm image of 14 nm diameter particles

Phase mode of PMMA 300 nm x 300 nm

Phase mode image of PMMA; 300 nm x 300 nm AFM image

 HOPG, 4 µm x 4 µm

Highly Oriented Pyrolitic Graphite (HOPG); 4 µm x 4 µm

DNA 2 µm x 2 µm, on multiple mica layers

DNA; 2 µm x 2 µm, on multiple mica layers

DNA; 1.5 µm x 1.5 µm AFM image

DNA; 1.5 µm x 1.5 µm AFM image

DVD pits, 6um height scan

Height image of flakes of graphene on a silicon surface

2µm x 2µm AFM image, Graphene sample

Individual graphene flakes on silicon sample, height image 2 µm x 2 µm

HOPG 2 µm x 2 µm

Highly Oriented Pyrolitic Graphite (HOPG); 2 µm x 2 µm, height image

STEPP microterraces

Cardiomyocytes; inverted optical miroscope image

Cardiomyocytes during nanomechanical testing experiments; inverted optical mircoscope image showing location of AFM probe from below

Ruled Grating Irregularities, 3-D image

Ruled Grating Irregularities, 3D image; 4 µm x 4 µm

BOPP polymer film; 2 µm x 2 µm.

BOPP Polymer; 2 µm x 2 µm biaxially oriented polypropylene (BOPP) film

Aluminum foil, 3D image; 50 µm x 50 µm

Aluminum foil, smooth side, 3D height image; 50 µm x 50 µm

Epithelial cell in liquid, 32 µm x 32 µm AFM image

Epithelial cell in liquid; 32 µm x 32 µm AFM image

Gold Nanoparticles, 100 nm

Gold Nanoparticles; 100 nm

Graphene sample, AFM image 11 µm x 11 µm

Graphene sample; AFM image 11 µm x 11 µm

Ruled Grating Irregularities, ruled diffraction grating

Ruled Grating Irregularities; 4 µm x 4 µm ruled diffraction grating, irregularities at edges of the apex on grating lines

SEBS polymer, phase image. 500 nm x 500 nm

SEBS polymer, phase image. 500 nm x 500 nm, smallest domains ~10 nm easily visible

MEMS Multiple Level Gear, Courtesy TX Tech, Sandia Ntl. Labs

MEMS Multiple Level Gear, Courtesy TX Tech, Sandia Ntl. Labs

MEMS High Performance Comb-Drive Actuator. Courtesy TX Tech, Sandia Ntl. Labs

MEMS High Performance Comb-Drive Actuator. Courtesy TX Tech, Sandia Ntl. Labs

Donut shaped particles 2.5 µm x 2.5 µm

Donut shaped nanoparticles; 2.5 µm x 2.5 µm

Gold nanotriangles

Gold nanotriangles; phase image showing texture on nanoplate surface

Patterned wafer after CMP; 50 µm x 50 µm

Structures on patterned wafer after CMP; 50 µm x 50 µm

Three component polymer phase image; 5µm x 5µm

Three component polymer, AFM phase image; 5µm x 5µm

Thermoplastics and rubbers blend. Phase image.

Thermoplastic and rubber blend. AFM phase image showing phase separation

SEBS polymer; phase image 1 µm x 1 µm.

SEBS polymer (styrene/ethylene/butylene polymer); AFM phase image, 1 µm x 1 µm.

Cardiomyocytes; LS-AFM inverted optical microscope

Cardiomyocytes; brightfield image from the LS-AFM inverted optical microscope

Quantum dots, 3D AFM image, 1.5µm x 1.5 µm

2.5 nm CdSe quantum dots, 3D AFM image, 1.5µm x 1.5 µm

Silicon wafer, AFM scan; 10 µm x 10 µm.

CMP-polished silicon wafer, AFM scan; 10 µm x 10 µm.

3d height image of 10 nm gold nanoparticles

Patterned wafer polished by CMP

Patterned wafer polished by CMP 10 µm x 10 µm on left; square shows area selected for AFM scanning at .5 µm x .5 µm. AFM scan reveals pockmarks on surface.

Patterned wafer polished by CMP, 10 µm x 10 µm

Patterned wafer polished by CMP, 3-D color scale. Analysis revealed surface roughness (Sa) of 1.69 nm

Silicon wafer, 3D AFM scan; 10 µm x 10 µm.

Silicon wafer, 3D AFM scan; 10 µm x 10 µm.

Patterned silicon wafer

Sidewall imaging of patterned semiconductor wafer


TT-2 AFM Modes

Modes Included with the TT-2 AFM:
The most commonly used modes are included with the TT-2 AFM. A simple drop down selector is used to select and display images in each of the modes.

Non-Vibrating (contact) In non-vibrating mode the deflection of the cantilever is held constant as the sample is scanned. This mode is used for hard samples, and for training purposes.
Vibrating (tapping) A piezoelectric ceramic is used to vibrate the cantilever at resonance. The amplitude of vibration is held constant as the sample is scanned. Both soft and hard samples are scanned with vibrating mode.
Phase While scanning in vibrating mode and holding the cantilever vibration amplitude constant, the phase shift between the drive signal and photo-detector are displayed. The phase image gives a map of the relative hardness at a sample's surface.
Frictional Force With the 4 segmant photodetector in the TT-2 AFM the L-R signal can be captured and displayed while scanning.

AFM cantilever resonance frequency shown in software

With the window above, the resonance frequency of a cantilever is readily measured. Additionally, the phase characteristics of the probe-sample interaction are captured.



Optional Modes

Optional modes available for the TT-2 are listed below. These modes can be purchase with the microscope or at a later time.

Conductive AFM (C-AFM)

Magnetic Force Microscopy (MFM)


Advanced Force Distance

Scanning Thermal Microscopy (SThM)

Scanning Tunneling Microscope (STM)

Dunk n Scan – Open Liquid Cell

Environmental Cell – Closed Liquid Cell

Electric Force Microscopy (EFM)

TT-2 AFM Options

The TT-2 has several options including advanced packages and accessories for various modes of scanning as well as educational packages.

High resolution TT-2 Atomic Force Microscope with acoustic enclosure

Atomic Force Microscope Configuration

TT-2 AFM Advanced Configuration

The TT-2 AFM Advanced Configuration provides all of the advanced features required for demanding projects. The benefit of purchasing this package includes a substantial package discounted price, as well as ensuring that you are ready for any demanding project as soon as your AFM is delivered to your lab.This package includes:


50 Micron Scanner

15 Micron Scanner

Motorized Focus Assist

Advanced Force Distance

Image Logger

Acoustic Cabinet

Break-Out Box

Documentation Package

TT-2 Atomic Force Microscope Advanced Configuration

Additional TT-2 AFM Options

Assembly Workshop Attendees build and learn to operate their TT-2 AFM, along with receiving training on the theory, operation and applications of an atomic force microscope. Learn More
High Resolution Scanner Allows a range of 15 X 15 microns in XY and 7 microns in Z. Learn More
Acoustic Enclosure Reduces unwanted acoustic and structural vibrations Learn More
Dunk and Scan Probe Holder Open liquid cell for scanning samples submerged in liquids. Can directly replace the TT-2 AFM probe holder of the NP, SA, or LS-AFM probe holder Learn More
Environmental Cell Permits scanning in inert environments or liquids Learn More
AFM Laboratory-Based Curriculum All-inclusive curriculum introduces undergraduate students to atomic force microscopy. Includes Student Manual, Teacher Manual, four samples, and eight probes. Learn More
Conductive AFM Measures the 2D conductivity of sample surfaces. Learn More
Magnetic Force Microscopy Measures the surface magnetic field of a sample by incorporating a magnetic probe into the AFM. Learn More
Lithography Uses an AFM probe to alter the physical or chemical property of a sample surface. Learn More
Advanced Force Distance Curves Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters such as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. Learn More
Scanning Tunneling Microscope The current flow between the probe and sample is used to control the feedback loop in the microscope when scanning electrically conductive samples.
Electric Force Microscope Using two pass scanning, the electric charge at a surface is imaged.
Focus Assist A motorized focus allows precise focus, following the probe during probe approach, and rapidly moving between focus on the sample and the probe.
Breakout Box BNC gives access to most of the signals in the Ebox
Document Package This option includeds all of the mechanical drawings, electronic schematics, and software protocols used in the microscope.
Image Logger This option allows display of six channels in the forward and reverse direction. It has a spectrum function as well as a six channel data logger.
TT-2 AFM Specifications

Table-Top AFM Specifications

Scanner Specifications

100 X 100 X 17 50 X 50 X 17 15 X 15 X 7
Engineering Specifications
XY Resolution 0.010 nm 0.005 nm 0.003 nm
XY Linearity <0.1% <0.1% <0.1%
Z Resolution 0.003 nm 0.003 nm 0.0015 nm
Z Linearity <0.1% <0.1% <0.1%
Performance Specializations
XY Range 100 µm 50 µm 15 µm
XY Linearity <1% <1% <1%
XY Resolution
Closed Loop <6 nm <3 nm <1 nm
Open Loop <1 nm <1 nm <0.3 nm
Z Range 17 µm 17 µm 7 µm
Z Linearity
Open Loop <5% <5% <5%
Closed Loop <1% <1% <1%
Z Sensor Noise 1 nm 1 nm N.A.
Z Feedback Noise <0.15 nm <0.15 nm <0.08 nm
Actuator Type Piezo Piezo Piezo
Design Modified Tripod Modified Tripod Modified Tripod
XY Sensor Type Strain Gauge Strain Gauge Strain Gauge
Z Sensor Type Strain Gauge Strain Gauge N.A.

Electronic Control Specifications

XY Scan 2 X 28-bits 24-bit Scan DAC, 4-bit gain 192 Khz
XY Linearization Control 2 X 24 bits 24 bit ADC 192 Khz
Z Axis Control Analog 4 amplifier – GPID 1 microvolt noise
Input Signal Bandwith 5 Mhz
Z axis Signal Capture 20 bits 16-bit ADC, 4-bit gain 50 Khz
Phase Signal Capture 2 X 16bits ADC 50 Khz
L-R Signal Capture 2 X 16 bits ADC 50 Khz
Amplitude Signal Capture 2 X 16 bits ADC 50 Khz
Z Error Signal Caputre 2 X 16 bits ADC 50 Khz
Main Controller MPU 80 Mz/105 DMipts, 32 Bits (5-stage pipeline, harvard architecture)
Excitation/Modulation Analog PLL 0-800 Khz
Communication USB 2.0
Signal capture specified includes the image logger option. Without Image Logger 1 X 16 bits

Optional Electronics Specifications

User Input Signal (1) 32 X 18 bits ADC 625 Khz
User Output (1) 32 X 18 bits DAC 625 Khz
User Monitor(1) 48 Lines Digital IO Mhz
Optional Controller MPU (2) 80 Mz/105 DMipts, 32 Bits (5-stage pipeline, harvard architecture)

(1)Optional User I/O upgrade
(2)Used for MFM, PhotoCorrect, EFM


Environment LabVIEW
Operating System Windows
Image Acquisition Real Time Display
(2 of 8 channels)
Control Parameters  
Setpoint Yes
Range Yes
Scan Rate Yes
Image Rotate 0 and 90 degrees
Laser Align Yes
Vibrating Freq. Display Yes
Force Distance Yes
Tip Approach Yes
Oscilloscope Yes
Image Store Format Industry Standard
Image Pixels 16 X 16 to 1024 X 1024
H.V. Gain Control XY and Z
Real Time Display Line Level, Light Shaded,
Grey Color Pallet
Calibration System Window
Probe Center Yes

Video Microscope

Minimum Zoom
Maximum Zoom
Field of view
2 x 2 mm
300 x 300 µm
20 µm
2 µm
Working Distance
114 mm
114 mm



* Z Noise performance depends greatly on the environment the TT-2 AFM is used in. Best Z noise performance is obtained in a vibration-free environment.

** Every effort is made to present accurate specifications, however, due to circumstances beyond AFMWorkshop's control specifications are subject to change. All specifications are accurate to +/-5%.

TT-2 AFM Product Datasheet PDF

Our Guarantee

AFMWorkshop provides a 100% money back guarantee. If our AFM's can't run your application, we will refund the full price*.

* see terms

Our Warranty

AFMWorkshop stands behind its products. We offer a two year return to factory warranty with every AFM we offer.



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