Atomic Force Microscope Probes
Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force distance scanning. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.
AFMWorkshop offersAFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only.
ACLA AFM/SPM Probe
ACLA AFM Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact)...Learn More...
SHOCONA AFM/SPM Probe
SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially...Learn More...