AFM Workshop


SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.

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Model ID: SHOCONA-10

SHOCONA AFM Probes are designed for contact mode applications with a shorter length, providing better sensitivity without compromising on spring constant requirements. The reflex side is coated with aluminum for increased laser signal quality.

Tip Specifications

Material: Silicon
Shape: Pyramidal
Height (µm): 14-16
Aspect Ratio: 1.5-3.0
ROC* (nm): 6
Coating: None

Cantilever Specifications

Material: Silicon
Shape: Rectangular
Reflex Coating: Al, 50 nm ± 5 nm


Parameter Nominal Value Minimum Value Maximum Value
Spring Constant (N/m) 0.14 0.01 0.60
Frequency (kHz) 21 8 37
Length (µm) 225 215 235
Width (µm) 46 41 51
Thickness (µm) 1.0 0.5 1.5


Download: SHOCONA AFM Probe Datasheet PDF



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