Characterization of Polymer Materials - AFM Training
Characterization of Polymer Materials - AFM Training
Two day course on the application of atomic force microscopy on various materials, with an emphasis on polymer materials. Hands-on lab work mixed with lecture sessions give participants a detailed understanding of the mechanisms involved. AFM is an essential tool for characterizing polymer structure, morphology, and other material properties.
Lab-Based Course: AFM in Materials Science and Polymers
Two Day Training Course
AFM Overview, Technology, and Application to Materials Science and Polymers.
This two day course mixes lecture with labwork on the basics of atomic force microscopy and its specific application to imaging various materials. AFM hardware and software will be reviewed, with special emphasis on imaging modes and image processing. While we utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, attendees with experience on any make or model of Atomic Force Microscope will find the labwork relevant and practical.
For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy as an essential tool for characterization of polymer structure, morphology, and material properties.
The Atomic Force Microscope provides several important advantages over other microscopies, including an unmatched ability to provide contrast with minimal sample preparation. Additionally, because the AFM provides mechanical interaction between the tip and sample, it provides unparalleled material-based contrast together with the ability to measure mechanical properties such as stiffness and adhesion on the nanoscale in many materials.
The ability to discriminate materials based on their mechanical properties, coupled with nanometer lateral resolution, makes AFM the method of choice to characterize a variety of materials.
Topics To Be Covered
Overview of AFM operation and different modes
Polymer sample preparation
Overview of AFM hardware
Overview of AFM software and image processing
Imaging artifacts and best practices
Tapping mode and phase imaging for optimizing contrast
Imaging mechanical properties
Force spectroscopy and associated mechanical measurements
Common models to interpret force distance curves
Hybrid AFM-spectroscopy characterization (Raman and IR)
Labwork
Scanning standard and reference samples
Topography and phase imaging
Force Spectroscopy
AFM calibration
To learn more about AFMWorkshop's Atomic Force Microscopes and their ability to characterize polymers, polymer blends, and polymer composites with nanometer lateral resolution, visit the AFMWorkshop Polymer Characterization Application page.