Atomic force microscopy images, photos, pictures, and surface scans made with high-sensitivity AFM Workshop microscopes. High accuracy and high-resolution images show nanomaterials, biomaterials, nanoparticles, polymers, and other samples in various visualizations. To learn about AFM image processing and Atomic Force Microscopy imaging click here.
AFM Images
750 pm silicon carbide terraces
3d height image of regular grid-patterned calibration sample
"Single E. coli bacterial cell, displaying fimbriae & polar flagellum"
1 and 3 nm quantum dots; 100 nm image
Self-assembled lipid nanotubes; 5 µm x 5 µm height image
3d height image of a mixture of 90 and 30nm PS nanoparticles
Multiphase Polymer Film - 3D shape from topography with phase signal overlaid as color
AFM image of defects on 0.3 nm Si Terraces; 4 µm x 4 µm
Latex spheres; 3 µm x 3 µm image of 173 nm latex spheres
Cardiomyocytes; brightfield image from the LS-AFM inverted optical microscope
2.5 nm CdSe quantum dots, 3D AFM image, 1.5µm x 1.5 µm
CMP-polished silicon wafer, AFM scan; 10 µm x 10 µm.
3d height image of 10 nm gold nanoparticles
Patterned wafer polished by CMP 10 µm x 10 µm on left; square shows area selected for AFM scanning at .5 µm x .5 µm. AFM scan reveals pockmarks on surface.
Patterned wafer polished by CMP, 3-D color scale. Analysis revealed surface roughness (Sa) of 1.69 nm
Silicon wafer, 3D AFM scan; 10 µm x 10 µm.
Patterned silicon wafer
Sidewall imaging of patterned semiconductor wafer
750 pm silicon carbide terraces
3d height image of regular grid-patterned calibration sample
"Single E. coli bacterial cell, displaying fimbriae & polar flagellum"
1 and 3 nm quantum dots; 100 nm image
Self-assembled lipid nanotubes; 5 µm x 5 µm height image
3d height image of a mixture of 90 and 30nm PS nanoparticles
Multiphase Polymer Film - 3D shape from topography with phase signal overlaid as color
AFM image of defects on 0.3 nm Si Terraces; 4 µm x 4 µm
Latex spheres; 3 µm x 3 µm image of 173 nm latex spheres
Cardiomyocytes; brightfield image from the LS-AFM inverted optical microscope
2.5 nm CdSe quantum dots, 3D AFM image, 1.5µm x 1.5 µm
CMP-polished silicon wafer, AFM scan; 10 µm x 10 µm.
3d height image of 10 nm gold nanoparticles
Patterned wafer polished by CMP 10 µm x 10 µm on left; square shows area selected for AFM scanning at .5 µm x .5 µm. AFM scan reveals pockmarks on surface.
Patterned wafer polished by CMP, 3-D color scale. Analysis revealed surface roughness (Sa) of 1.69 nm